Enhancing automatic landmark localization in X-ray images using combined segmentation and regression models:

Ashkan Zarghami1, Sebastián Amador Sánchez2,3, Philippe Van Overschelde4

  • 1Department of Electronics and Informatics, Vrije Universiteit Brussel, Pleinlaan 2, 1050, Brussels, Belgium.

Scientific Reports
|April 22, 2026
PubMed

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