Characterizing Defect Dynamics in Silicon Carbide Using Symmetry-Adapted Collective Variables and Machine Learning

Soumajit Dutta1, Cunzhi Zhang1, Gustavo Perez Lemus1

  • 1Pritzker School of Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States.

Summary

Machine learning potentials accelerate simulations of silicon carbide (SiC) divacancies, crucial for quantum computing qubits. This method accurately predicts defect behavior, enabling optimized material processing for enhanced qubit stability.

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