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Characterizing Defect Dynamics in Silicon Carbide Using Symmetry-Adapted Collective Variables and Machine Learning
Soumajit Dutta1, Cunzhi Zhang1, Gustavo Perez Lemus1
1Pritzker School of Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States.
Machine learning potentials accelerate simulations of silicon carbide (SiC) divacancies, crucial for quantum computing qubits. This method accurately predicts defect behavior, enabling optimized material processing for enhanced qubit stability.
Area of Science:
- Materials Science
- Quantum Computing
- Computational Physics
Background:
- Silicon carbide (SiC) divacancies are promising for spin-defect qubits due to long coherence times and optical addressability.
- Simulating SiC defect dynamics is computationally intensive due to high activation barriers, limiting first-principles molecular dynamics studies.
Purpose of the Study:
- To develop and implement machine learning interatomic potentials (MLIPs) for accelerated and accurate SiC defect dynamics simulations.
- To retain first-principles accuracy in simulations of defect formation, motion, and thermodynamic stability.
Main Methods:
- An active learning strategy was employed, combining symmetry-adapted collective variable discovery and enhanced sampling.
- Density functional theory (DFT) was used for calculating energies and forces to train an E(3)-equivariant MLIP (Allegro model).
- Simulations were performed on multidefect 216-atom SiC supercells.
Main Results:
- The trained MLIP achieved DFT-level accuracy for defect transition activation free energy barriers.
- Efficient and stable simulations of large supercells were enabled, allowing analysis of defect thermodynamics and kinetics.
- The temperature dependence of defect stability and kinetics was analyzed.
Conclusions:
- MLIPs significantly accelerate SiC defect dynamics simulations while maintaining high accuracy.
- The study proposes an optimal annealing temperature to maximize the stabilization of VV divacancies for qubit applications.
- This approach facilitates the study of complex defect phenomena in materials for quantum technologies.
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