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Atomic Force Microscopy01:08

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High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
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Snapshot spectral fringe projection profilometry.

Tomoya Hoshino, Tanaka Issei, Iwanuma Naoki

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    |April 24, 2026
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    Summary

    This study introduces spectral fringe projection for 3D object reconstruction using a single camera frame. The technique adapts phase-shifting methods for spectral fringe fields, enabling efficient 3D measurements.

    Area of Science:

    • Optics and Photonics
    • 3D Imaging and Metrology
    • Computer Vision

    Background:

    • Traditional fringe projection profilometry requires multiple frames and controlled phase shifts.
    • Spectral fringe projection encodes spatial information within the spectrum of projected fringes.
    • Snapshot spectral imaging captures spatial and spectral information simultaneously.

    Purpose of the Study:

    • To adapt phase-shifting techniques for spectral fringe projection.
    • To enable single-frame 3D height profile reconstruction of opaque objects.
    • To demonstrate the feasibility of dynamic 3D measurements with this technique.

    Main Methods:

    • Utilizing a diffraction grating with a commercial projector to create spectrally varying harmonic fringes.

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  • Employing a snapshot spectral imager for simultaneous spatial and spectral data acquisition.
  • Modifying standard phase-shifting algorithms to accommodate uncontrolled spectral fringe phases.

    • Main Results:

    • Successfully reconstructed the height profile of a static, stair-stepped object from a single camera frame.
    • Generated a 3D video of a moving hand, demonstrating dynamic measurement capabilities.
    • Validated the adapted phase-shifting approach for spectral fringe analysis.

    Conclusions:

    • Spectral fringe projection combined with snapshot spectral imaging offers a robust method for single-frame 3D reconstruction.
    • The adapted phase-shifting technique effectively overcomes challenges associated with uncontrolled spectral fringe phases.
    • This approach holds potential for high-speed and non-contact 3D metrology applications.