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Updated: Apr 30, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Optical transmission and spectroscopic ellipsometry data of fused Quartz: Estimating dielectric function with
Sanat Kumar Gogoi1, Harshavardhan Reddy Kalluru2
1Digboi College, Digboi, Assam, 786171, India.
Abstract:
The manuscript discusses the procedure of estimating refractive index from optical transmission data of a solid material. Fused Quartz is used as the standard sample in this manuscript. First the refractive index data is measured directly using the spectroscopic ellipsometry technique. Subsequently, the transmission data is collected with a transmission spectrometer. The transmission data is then converted into extinction coefficient and subsequently transformed in to refractive index, by direct Krönig-Kramers (KK) analysis code. Further using singly and doubly subtractive KK analysis, the refractive index is estimated. The derived set of refractive indices from KK analysis, are then compared to the measured spectroscopic ellipsometry data. The refractive index and extinction coefficient are then used to estimate the relative dielectric permittivity function of the material.
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