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Phase measurement of surface-bearing holographic optical elements
Optics Letters
|May 1, 2026
Summary
This study introduces a new method for accurately measuring the phase of holographic optical elements (HOEs). The technique separates surface and internal phase effects, crucial for improving HOE performance in displays and imaging.
Area of Science:
- Optics and Photonics
- Metrology
- Materials Science
Background:
- Holographic optical elements (HOEs) are vital components in modern optical systems, including displays and imaging.
- Accurate phase characterization of HOEs is difficult due to combined surface and internal refractive index effects.
Purpose of the Study:
- To develop a novel phase measurement technique for HOEs.
- To accurately decouple and quantify the internal phase distribution of HOEs, independent of surface topography.
Main Methods:
- Utilized four-step phase-shifting interferometry combined with the angular selectivity of HOEs.
- Separated total phase into surface and internal phase components.
- Decoded internal phase from total phase by eliminating surface effects.
Main Results:
- Successfully measured the total and surface phase distributions of HOEs.
- Isolated and quantified the internal phase component induced by refractive index modulation.
- Validated the method's accuracy through a phase compensation experiment.
Conclusions:
- The proposed method effectively and practically characterizes HOE phase.
- This technique enables accurate phase correction for improved HOE performance.
- Offers a solution for overcoming challenges in HOE metrology.
