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Ultra-deep-hole high-precision visual inspection system.

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    A new optical inspection system offers high-precision measurement for small, deep holes. This system achieves sub-10μm resolution and accurate panoramic stitching for industrial applications.

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    Area of Science:

    • Optical Engineering
    • Metrology
    • Industrial Inspection

    Background:

    • Accurate measurement of inner walls in small-diameter, ultra-deep holes is challenging.
    • Existing methods often lack the required precision and resolution for critical industrial applications.

    Purpose of the Study:

    • To develop a high-precision optical inspection system for small-diameter ultra-deep-hole measurement.
    • To introduce novel methods for quantitative optical design and distortion correction in such systems.

    Main Methods:

    • Developed an ultra-slim, long-working-length imaging system using reverse-tracing flux matching (RTFM) for optical design.
    • Proposed a bidirectional ray-tracing calibration (BRTC) method for accurate panoramic unwrapping of non-planar surfaces.
    • Fabricated a prototype endoscope (UHVE) and conducted experimental evaluations.

    Main Results:

    • The UHVE system achieved a practical spatial resolution better than 10μm for bore sizes of 4-8mm.
    • Demonstrated high imaging quality, low tolerance sensitivity, and strong thermal robustness through optical simulations.
    • Validated panoramic stitching accuracy with lateral and axial errors of 4.873μm and 10.190μm, respectively.

    Conclusions:

    • The developed UHVE system provides a compact and reliable solution for high-precision inner-wall inspection.
    • The RTFM and BRTC methods enable accurate optical design and distortion correction for challenging geometries.
    • This technology advances inspection capabilities in small-aperture ultra-deep-hole applications.