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Multiplex Chemical Imaging Based on Broadband Stimulated Raman Scattering Microscopy
Published on: July 25, 2022
Jiawei He1,2,3, Yonglin Bai1,2, Zishang Jv1
1Key Laboratory of Ultrafast Photoelectric Diagnostic Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China.
This study introduces an improved penalized least squares method for Raman spectral baseline correction. The novel approach enhances accuracy and preserves spectral details by optimizing noise classification and parameter adjustment.
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