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Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
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Silicon Dioxide Multi-Mode Interference Spectrometers.

James G Harkness1, Denghui Pan2, Helio Ramollari2

  • 1Department of Electrical and Computer Engineering, Brigham Young University, Provo, UT 84602, USA.

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PubMed
Summary
This summary is machine-generated.

This study introduces a fully silicon-based multi-mode interferometer (MMI) spectrometer. This novel spectrometer utilizes a silica core waveguide, achieving a signal-to-noise ratio (SNR) of three with improved performance over previous SU-8 core designs.

Keywords:
PECVD silicon dioxideSU-8micro-spectrometermulti-mode interferometerreconstructive spectrometersurface roughening

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Area of Science:

  • Photonics and Spectrometry
  • Materials Science and Engineering

Background:

  • Multi-mode interferometer (MMI) spectrometers reconstruct spectral information by analyzing light propagation patterns within waveguides.
  • Previous MMI spectrometer designs utilized SU-8 core waveguides with etched nanograss scattering surfaces.

Purpose of the Study:

  • To develop a fully silicon-based MMI spectrometer for enhanced performance and material compatibility.
  • To investigate the fabrication of scattering features in silica core waveguides for improved light pattern imaging.

Main Methods:

  • Fabrication of a silica core MMI waveguide with scattering features created using SU-8 nanograss as an etch mask.
  • Utilized reactive ion etching (RIE) to transfer the SU-8 nanograss pattern into the silica core.
  • Optimized RIE parameters for precise feature creation and waveguide performance.

Main Results:

  • Successfully created a fully silicon-based MMI spectrometer.
  • Achieved a signal-to-noise ratio (SNR) of three at an incident light power of -68 dBm.
  • The silica core MMI spectrometer demonstrated a performance improvement of nearly 6 dB compared to SU-8 core designs.

Conclusions:

  • The developed silica core MMI spectrometer represents a significant advancement in micro-spectrometer technology.
  • The use of silicon-based materials and optimized RIE processes enables lower incident light power requirements.
  • This technology holds promise for miniaturized and efficient spectral analysis applications.