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Updated: May 5, 2026

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
Published on: April 4, 2017
Silicon Dioxide Multi-Mode Interference Spectrometers
James G Harkness1, Denghui Pan2, Helio Ramollari2
1Department of Electrical and Computer Engineering, Brigham Young University, Provo, UT 84602, USA.
Abstract:
A multi-mode interferometer (MMI) spectrometer is a type of reconstructive micro-spectrometer based on imaging light propagation patterns in MMI waveguides. A waveguide scattering surface accentuates imaging light patterns in the multi-mode interferometer. This technology has been proven with an SU-8 core waveguide with an etched SU-8 nanograss scattering surface. This paper describes our creation of a fully silicon-based spectrometer using a silica core MMI waveguide. Scattering features were created in silica using SU-8 nanograss as an etch mask in a reactive ion etch (RIE). With optimized etch parameters, the silica core MMI spectrometer achieved an SNR of three with an incident light power of -68 dBm, which was almost 6 dB lower than designs with an SU-8 core.
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