Non-Destructive Quantitative Characterization of Constituent Content in C/C-SiC Composites Based on Multispectral...

Area of Science:

• Materials Science
• Physics
• Engineering

Background:

• Non-destructive quantitative characterization of constituent content in C/C-SiC composites is challenging.
• Photon-counting X-ray measurements are affected by detector non-idealities and beam-hardening effects.

Purpose of the Study:

• To develop a physics-guided framework for accurate, non-destructive constituent content characterization in C/C-SiC composites.
• To address distortions in multispectral attenuation features caused by detector response and polychromatic X-ray sources.

Main Methods:

• A Geant4 11.2-based detector-response model was integrated into a unified correction workflow.
• Beam-hardening compensation was applied to recover physically consistent multispectral attenuation vectors.
• A theoretical database of SiC mass fractions was established for constituent inversion.

Main Results:

• The framework effectively suppresses thickness-dependent bias in attenuation measurements.
• An average relative error below 3% was achieved for pure aluminum.
• SiC mass fraction in C/C-SiC composites was quantified with accuracy better than 3 wt%.

Conclusions:

• The proposed method offers a practical non-destructive route for characterizing heterogeneous ceramic-matrix composites.
• This technique is valuable for manufacturing quality control and in-service assessment of C/C-SiC materials.