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Area of Science:

  • Condensed Matter Physics
  • Materials Science
  • Surface Science

Background:

  • Electric field-induced Kerr rotation in metallic thin films is a phenomenon of interest for spintronic and optoelectronic applications.
  • Previous studies primarily attributed this effect to nonequilibrium orbital moment accumulation via the orbital Edelstein effect.
  • The role of surface effects and their interplay with bulk phenomena remained less explored.

Purpose of the Study:

  • To investigate the contributions to electric field-induced Kerr rotation in metallic thin films.
  • To elucidate the underlying physical mechanisms, including both known and potentially overlooked effects.
  • To differentiate the contributions of orbital accumulation and surface effects on Kerr rotation for different polarizations.

Main Methods:

  • Employed a combination of density functional theory calculations and optical modeling.
  • Investigated the modification of optical conductivity within the surface region (a few nanometers).
  • Analyzed the impact of dual mirror symmetry breaking from the surface and applied electric field.

Main Results:

  • Established that Kerr rotation has contributions from both orbital Edelstein effect and a previously unrecognized surface Pockels effect.
  • Demonstrated that both effects stem from symmetry breaking at the surface and by the applied DC electric field.
  • Showed that for Pt thin films, these two effects are comparable and influence s- and p-polarized light differently: orbital Edelstein effect yields similar Kerr rotations, while surface Pockels effect results in opposing values.

Conclusions:

  • The electric field-induced Kerr rotation in metallic thin films is a result of a combined mechanism involving orbital Edelstein effect and surface Pockels effect.
  • The surface Pockels effect, driven by DC field-induced changes in wave functions, plays a significant role alongside orbital accumulation.
  • Understanding these distinct contributions is crucial for tailoring optical and spintronic properties of thin films.