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Updated: May 6, 2026

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Author Spotlight: Advances in Nanoscale Infrared Spectroscopy to Explore Multiphase Polymeric Systems
Published on: June 23, 2023
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Revealing Buried Thermal Responses in Polymer Multilayers Using Photothermal Mirror Infrared Spectroscopy
Yide Zhang1,2, Nelson G C Astrath1,3, Lena Neubauer1,2
1Institute of Chemical Technologies and Analytics, Technische Universität Wien, Vienna, Austria.
Applied Spectroscopy
|May 5, 2026
Summary
The photothermal mirror infrared (PTM-IR) technique unexpectedly enhances signals with thicker overlayers, unlike conventional methods. This breakthrough allows for non-destructive depth-resolved characterization of buried layers in multilayer materials.
Area of Science:
- Materials Science
- Optics
- Spectroscopy
Background:
- Depth-resolved characterization of buried layers is vital for understanding multilayer material properties.
- Conventional photothermal techniques face signal attenuation with increasing overlayer thickness.
Purpose of the Study:
- To demonstrate that the photothermal mirror infrared (PTM-IR) technique shows enhanced signals with increasing overlayer thickness.
- To develop a quantitative model for predicting photothermal signal behavior in multilayer systems.
- To establish PTM-IR as a tool for non-destructive subsurface characterization.
Main Methods:
- Combined finite-element analysis (FEA) and one-dimensional analytical modeling using Green's function formalism.
- Experimental validation using poly(methyl methacrylate)-polystyrene (PMMA-PS) bilayers on CaF2 substrates.
- Photothermal Mirror Infrared (PTM-IR) spectroscopy.
Main Results:
- PTM-IR signal transient increases with overlayer thickness due to enhanced thermal confinement and surface displacement.
- FEA and analytical models accurately predict temperature and surface displacement dynamics.
- Excellent agreement between experimental measurements and theoretical predictions was achieved.
Conclusions:
- PTM-IR is a non-destructive infrared technique for probing buried absorbers.
- The technique allows for the determination of both absorber and overlayer thicknesses.
- PTM-IR extends the capabilities of photothermal methods for deeper subsurface characterization.
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