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Related Experiment Video

Updated: May 6, 2026

Author Spotlight: Advances in Nanoscale Infrared Spectroscopy to Explore Multiphase Polymeric Systems

Author Spotlight: Advances in Nanoscale Infrared Spectroscopy to Explore Multiphase Polymeric Systems

Published on: June 23, 2023

Revealing Buried Thermal Responses in Polymer Multilayers Using Photothermal Mirror Infrared Spectroscopy.

Yide Zhang^1,2, Nelson G C Astrath^1,3, Lena Neubauer^1,2

¹Institute of Chemical Technologies and Analytics, Technische Universität Wien, Vienna, Austria.

Applied Spectroscopy

|May 5, 2026

Summary

This summary is machine-generated.

The photothermal mirror infrared (PTM-IR) technique unexpectedly enhances signals with thicker overlayers, unlike conventional methods. This breakthrough allows for non-destructive depth-resolved characterization of buried layers in multilayer materials.

Keywords:

Green’s function modeling PTM-IR Photothermal mirror infrared depth-resolved spectroscopy polymer bilayers

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Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

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Published on: May 15, 2017

Area of Science:

Materials Science
Optics
Spectroscopy

Background:

Depth-resolved characterization of buried layers is vital for understanding multilayer material properties.
Conventional photothermal techniques face signal attenuation with increasing overlayer thickness.

Purpose of the Study:

To demonstrate that the photothermal mirror infrared (PTM-IR) technique shows enhanced signals with increasing overlayer thickness.
To develop a quantitative model for predicting photothermal signal behavior in multilayer systems.
To establish PTM-IR as a tool for non-destructive subsurface characterization.

Main Methods:

Combined finite-element analysis (FEA) and one-dimensional analytical modeling using Green's function formalism.
Experimental validation using poly(methyl methacrylate)-polystyrene (PMMA-PS) bilayers on CaF2 substrates.
Photothermal Mirror Infrared (PTM-IR) spectroscopy.

Main Results:

PTM-IR signal transient increases with overlayer thickness due to enhanced thermal confinement and surface displacement.
FEA and analytical models accurately predict temperature and surface displacement dynamics.
Excellent agreement between experimental measurements and theoretical predictions was achieved.

Conclusions:

PTM-IR is a non-destructive infrared technique for probing buried absorbers.
The technique allows for the determination of both absorber and overlayer thicknesses.
PTM-IR extends the capabilities of photothermal methods for deeper subsurface characterization.