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Texture conditioned GAN based self supervised framework for fabric defect detection.
1Department of Computer Science and Engineering, Annapoorana Engineering College, Salem, TamilNadu, India. sujithashokkumar36@gmail.com.
Scientific Reports
|May 5, 2026
Summary
This study introduces a Self-Supervised Texture-Decomposition and Defect Amplification Network (STDAN) for automated fabric inspection. STDAN effectively detects textile defects without needing labeled data, improving quality control in manufacturing.
Area of Science:
- Computer Vision
- Machine Learning
- Textile Manufacturing
Background:
- Automated fabric inspection is crucial for consistent textile quality in high-speed manufacturing.
- Existing methods often require extensive labeled data and struggle with complex textures, leading to inaccuracies.
- There is a need for data-efficient anomaly detection that preserves fine-grained texture semantics.
Purpose of the Study:
- To develop a novel, annotation-free framework for fabric defect detection.
- To address the limitations of supervised methods and improve detection on complex fabrics.
- To enhance the reliability of automated quality inspection systems.
Main Methods:
- Introduced the Self-Supervised Texture-Decomposition and Defect Amplification Network (STDAN).
- Decomposed fabric images into texture bases and anomaly cues using a texture-consistency encoder.
- Employed a generative defect amplification module and a contrastive self-supervised objective for feature-level learning.
Main Results:
- STDAN achieved superior detection accuracy and localization precision on public benchmarks.
- Demonstrated effectiveness in detecting small, low-contrast, and previously unseen defects.
- Showcased strong robustness to texture variations and illumination changes.
Conclusions:
- STDAN offers a scalable, annotation-free solution for reliable fabric quality inspection.
- The framework successfully combines texture decomposition and feature-level defect amplification.
- The method is practically applicable in industrial environments, improving defect detection capabilities.
