Recent Advances in Topological Materials for Photodetection

Tongyu Wang1, Cong Chen1,2,3

  • 1State Key Laboratory of Smart Power Distribution Equipment and System, School of Materials Science and Engineering, Hebei University of Technology, Tianjin, China.

Summary

Topological materials offer unique advantages for photodetectors, enabling broadband detection and ultrafast responses. This review highlights their progress and future potential in infrared and terahertz applications.

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