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Double Pulse RLIBS: A New Approach for Sensitive and Quasi-Non-Destructive Sample Analysis.

Ismail Elhamdaoui¹, Samira Selmani¹, Paul Bouchard²

¹Centre Énergie Matériaux Télécommunications, Institut national de la recherche scientifique, 1650 Lionel-Boulet Blvd., Varennes, Quebec J3X 1P7, Canada.

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Summary

This summary is machine-generated.

A new double-pulse resonance laser-induced breakdown spectroscopy (DP-RLIBS) method offers highly sensitive trace element detection with minimal sample damage. This advanced technique significantly outperforms conventional LIBS for analyzing delicate materials.

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Area of Science:

Analytical Chemistry
Spectroscopy
Materials Science

Background:

Conventional laser-induced breakdown spectroscopy (LIBS) can cause significant sample damage, limiting its use for delicate analyses.
High sensitivity for trace element detection is crucial in various scientific and industrial applications.

Purpose of the Study:

To investigate a novel regime of double-pulse resonance laser-induced breakdown spectroscopy (DP-RLIBS).
To evaluate the sensitivity and sample-damaging characteristics of DP-RLIBS compared to conventional LIBS.
To demonstrate the potential of DP-RLIBS for trace element analysis in copper samples.

Main Methods:

Utilizing a dual-pulse laser system where one pulse ablates the sample surface and a second, delayed pulse excites the generated vapor.
Analyzing trace elements lead and iron in copper matrices using specific excitation and fluorescence wavelengths.
Comparing DP-RLIBS performance (limit of detection, calibration linearity) with conventional LIBS.
Assessing sample integrity using scanning electron microscopy (SEM) after multiple laser shots.

Main Results:

DP-RLIBS achieved ultra-low limits of detection: 0.6 ppm for lead and 0.8 ppm for iron.
Conventional LIBS showed significantly higher limits of detection (85 ppm for lead) under identical energy and shot conditions.
DP-RLIBS demonstrated excellent linearity for lead (0-1100 ppm) and quadratic behavior for iron (0-2100 ppm).
SEM analysis confirmed no discernible sample damage with DP-RLIBS even after 10,000 shots, unlike conventional LIBS.

Conclusions:

DP-RLIBS represents a significant advancement for highly sensitive trace element detection.
The technique offers virtually non-destructive analysis, ideal for sensitive or valuable samples.
DP-RLIBS surpasses conventional LIBS in sensitivity and minimal sample alteration, opening new analytical possibilities.