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Updated: May 9, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Haowei Sun1, Jianqiang Qian1, Yanan Chen1
1Beihang University, No. 37, Xueyuan Road, Haidian District, Beijing, 100191, Beijing, China.
A new segmented fixture design enhances bimodal atomic force microscopy (bimodal-AFM) by boosting higher eigenmode response. This improves nanoscale material characterization on polymer surfaces in ambient conditions.
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