Single-shot extended-depth-of-field fourier light field microscopy enabled by a distorted grating.

Junmin Huang1, Xunliang Zhang2, Zhenyu Deng1

  • 1Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China.

Summary

We developed an extended depth-of-field Fourier light-field microscopy (EDOF-FLFM) system to improve 3D imaging. This rapid volumetric microscopy technique doubles the depth of field without sacrificing resolution in a single snapshot.

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