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Updated: May 12, 2026

A Multimodal Wide-Field Fourier-Transform Raman Microscope
Published on: December 30, 2025
Single-shot extended-depth-of-field fourier light field microscopy enabled by a distorted grating.
Junmin Huang1, Xunliang Zhang2, Zhenyu Deng1
1Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China.
We developed an extended depth-of-field Fourier light-field microscopy (EDOF-FLFM) system to improve 3D imaging. This rapid volumetric microscopy technique doubles the depth of field without sacrificing resolution in a single snapshot.
Area of Science:
- Microscopy
- Optical Imaging
- Biophysics
Background:
- Microscopy faces a trade-off between depth of field (DOF) and resolution.
- Rapid volumetric imaging requires high speed and extended DOF.
- Conventional Fourier light-field microscopy (FLFM) has limitations in DOF.
Purpose of the Study:
- To overcome the DOF-resolution trade-off in rapid volumetric microscopy.
- To introduce an extended depth-of-field Fourier light-field microscopy (EDOF-FLFM) system.
- To enable high-speed, large-range, 3D imaging with enhanced DOF.
Main Methods:
- Utilized a distorted phase grating for Fourier-plane phase modulation.
- Employed ±1st diffraction orders to capture two axial depths simultaneously.
- Reconstructed light-field data using Richardson-Lucy deconvolution.
Main Results:
- Achieved an approximately twofold increase in DOF compared to conventional FLFM.
- Extended DOF without compromising lateral resolution.
- Demonstrated effective DOF extension in a single snapshot.
Conclusions:
- The EDOF-FLFM system offers a novel solution for high-speed 3D microscopy.
- This method enables large-range snapshot volumetric imaging.
- Addresses the fundamental challenge of DOF extension in microscopy.
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