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Related Experiment Video

Updated: May 13, 2026

Fabrication and Characterization of Optical Tissue Phantoms Containing Macrostructure
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Published on: February 12, 2018

Advanced Characterization of 2D Materials Using SLEEM/ToF.

Veronika Pizúrová1, Jakub Piňos1, Lukáš Průcha1

  • 1Institute of Scientific Instruments of the CAS, Královopolská 147, 612 64 Brno, Czech Republic.

Nanomaterials (Basel, Switzerland)
|May 12, 2026
PubMed
Summary
This summary is machine-generated.

This study introduces a new low-energy electron microscopy technique for characterizing two-dimensional materials. The advanced system offers enhanced surface sensitivity and reduced damage, enabling detailed analysis of graphene and other 2D materials.

Keywords:
2D materialsEELSIMFPMoS2Raman spectroscopySLEEMTi3C2ToFXPSgrapheneh-BN

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Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Two-dimensional (2D) materials possess unique electronic properties sensitive to surface conditions.
  • Characterizing these properties requires high surface sensitivity at low electron energies.
  • Existing methods like conventional scanning low-energy electron microscopy (SLEEM) have limitations.

Purpose of the Study:

  • To investigate graphene, hexagonal boron nitride (h-BN), molybdenum disulfide (MoS2), and titanium carbide (Ti3C2) MXene.
  • To evaluate an advanced home-built scanning low-energy electron microscopy system combined with time-of-flight electron spectroscopy (SLEEM/ToF).
  • To demonstrate the capability of this system for surface-sensitive analysis of 2D materials.

Main Methods:

  • Utilized a novel SLEEM/ToF system recording electron energy-loss spectra (EELS) from transmitted electrons.
  • Employed low electron landing energies (5-1500 eV) for enhanced surface sensitivity and reduced beam damage.
  • Complemented with scanning transmission electron microscopy (STEM), Raman spectroscopy, and X-ray photoelectron spectroscopy (XPS).

Main Results:

  • Successfully acquired low-energy ToF-EELS spectra for graphene, h-BN, MoS2, and Ti3C2 MXene.
  • Determined average plasmon positions for all investigated 2D materials.
  • Quantitatively determined the inelastic mean free path (IMFP) for graphene (1.9 ± 0.2 nm in the 10-50 eV range).

Conclusions:

  • The developed SLEEM/ToF system provides enhanced surface sensitivity and reduced beam-induced damage compared to conventional methods.
  • This technique enables direct probing of π and π + σ plasmon excitations in 2D materials.
  • SLEEM/ToF shows significant potential for the detailed surface analysis of various 2D materials.