Related Experiment Video
Updated: May 17, 2026

08:48
Low-cost Custom Fabrication and Mode-locked Operation of an All-normal-dispersion Femtosecond Fiber Laser for Multiphoton Microscopy
Published on: November 22, 2019
All-fiber-referenced ultra-narrow-linewidth laser with broad wavelength agility
Optics Letters
|May 15, 2026
Summary
Researchers developed an ultra-narrow-linewidth laser using a two-stage fiber locking technique. This method significantly reduces frequency noise for precision metrology applications.
Area of Science:
- Optics and Photonics
- Laser Physics
- Precision Measurement
Background:
- External-cavity diode lasers (ECDLs) typically have broad linewidths (>100 kHz).
- Achieving ultra-narrow linewidths is crucial for high-precision scientific applications.
- Locking broad-linewidth lasers to high-finesse references presents significant technical challenges.
Purpose of the Study:
- To demonstrate an ultra-narrow-linewidth laser by locking a commercial ECDL to a cascaded, all-fiber reference.
- To overcome the difficulty of directly locking broad-linewidth lasers to high-finesse fiber references.
- To achieve significant frequency noise suppression and broad wavelength tunability.
Main Methods:
- Employed a two-stage locking scheme involving a fiber ring resonator for pre-stabilization.
- Utilized a fiber delay line interferometer for subsequent spectral purification.
- Locked a commercial external-cavity diode laser (ECDL) to the cascaded fiber reference.
Main Results:
- Achieved a 100-ms 1/f integrated linewidth of 28 Hz.
- Demonstrated a fundamental linewidth of 0.1 Hz.
- Attained frequency-noise suppression exceeding 80 dB between 30 Hz and 1 kHz offset frequencies.
- Validated the scheme's effectiveness across the ECDL tuning range of 1520-1580 nm.
Conclusions:
- The developed two-stage fiber locking scheme successfully produces an ultra-narrow-linewidth laser.
- The technique offers both ultra-low phase noise and broad wavelength agility.
- This laser system is suitable for demanding precision metrology applications.
