High-Yield Engineering and Identification of Oxygen-Related Modified Divacancies in 4H-SiC

Qi-Cheng Hu1,2,3,4, Ji-Yang Zhou1,2,3, Shuo Ren1,2,3,4

  • 1Laboratory of Quantum Information, University of Science and Technology of China, Hefei, Anhui, China.

Summary

Engineered oxygen-vacancy complexes in silicon carbide (SiC) offer high yields for quantum applications. This research identifies four types of these defects, paving the way for advanced solid-state quantum technologies.

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