Related Experiment Video
Updated: May 22, 2026

11:49
Enhanced Genetic Analysis of Single Human Bioparticles Recovered by Simplified Micromanipulation from Forensic ‘Touch DNA’ Evidence
Published on: March 9, 2015
Corrigendum to "Toward better AFIS practice and process in the forensic fingerprint environment" [Forensic Sci. Int.:
1University of Twente, Enschede, the Netherlands.
Forensic Science International. Synergy
|May 21, 2026
Summary
This study corrects a previously published article's DOI. The correction ensures accurate referencing for future scientific research and data retrieval.
Area of Science:
- Scientific publishing
- Bibliometrics
- Scholarly communication
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Atomic Force Microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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IR spectra are divided into two main regions: the diagnostic region and the fingerprint region. The diagnostic region of the spectrum lies above 1500 cm−1. The absorptions resulting from single-bond vibrations of the N–H, C–H, and O–H stretch at higher wavenumbers and appear on the left side of the spectrum. The stretching absorptions of the C≡C and C≡N occur between 2100–2300 cm−1. In contrast, those arising from stretching absorptions of the C=O, C=N, and C=C occur between 1600–1850 cm−1.
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