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Published on: October 1, 2019
Pose-guided YOLO-CED: A two-stage framework for robust SMD-PCB defect detection in mobile manipulators.
Mingxiao Sun1, Qiang Zhao1, Qiuyu Zhang1
1Harbin University of Science and Technology, No 52, Xuefu Road, Nangang District Harbin, 150080, China.
Summary
This study introduces YOLO-CED, a two-stage method for detecting defects on printed circuit boards (PCBs) using mobile manipulators. The approach enhances accuracy in identifying surface-mount device (SMD) flaws, improving automated manufacturing inspection.
Area of Science:
- Robotics and Automation
- Computer Vision
- Manufacturing Engineering
Background:
- Printed circuit board (PCB) and surface-mount device (SMD) stability are critical in industrial production.
- Mobile manipulators face challenges in automated PCB inspection due to pose uncertainty, SMD variations, and computational limits.
- Current methods struggle with stable defect identification across diverse categories.
Purpose of the Study:
- To propose a robust two-stage method for SMD-PCB defect detection using mobile manipulators.
- To enhance the accuracy and stability of defect identification in automated manufacturing inspection.
- To address limitations in current automated visual inspection systems for PCBs.
Main Methods:
- A two-stage approach combining target pose estimation with a novel YOLO-CED model.
- Integration of a color attention mechanism for adaptive feature weighting and robust pose estimation.
- Implementation of an adaptive gating mechanism, multi-sensory field feature acquisition, and edge sharpening for enhanced feature fusion.
- Utilizing a detail restoration branch for precise boundary localization and an L2-normalized self-supervised multi-head attention mechanism.
Main Results:
- The proposed YOLO-CED method achieved a mean average precision (mAP) of 81.7% on the HUSTPCB dataset, outperforming lightweight models.
- The algorithm demonstrated successful application on a mobile platform with a robotic arm for flexible PCB manufacturing inspection.
- Validation on the PKU-Market-PCB dataset confirmed the universality and transferability of the YOLO-CED approach.
Conclusions:
- The developed two-stage method effectively addresses challenges in mobile manipulator-based PCB defect detection.
- The YOLO-CED algorithm offers a promising solution for stable and accurate SMD-PCB defect identification in industrial settings.
- The system's performance highlights the potential of mobile manipulators in flexible and automated PCB manufacturing processes.