Pose-guided YOLO-CED: A two-stage framework for robust SMD-PCB defect detection in mobile manipulators.

Mingxiao Sun1, Qiang Zhao1, Qiuyu Zhang1

  • 1Harbin University of Science and Technology, No 52, Xuefu Road, Nangang District Harbin, 150080, China.

Summary

This study introduces YOLO-CED, a two-stage method for detecting defects on printed circuit boards (PCBs) using mobile manipulators. The approach enhances accuracy in identifying surface-mount device (SMD) flaws, improving automated manufacturing inspection.

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