Updated: May 25, 2026

A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks
Published on: April 28, 2023
Yukihiro Matsumoto1, Kento Takenaka1, Hiromasa Sato2
1Department of Applied Physics and Physico-Informatics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan.
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This study used advanced microscopy to analyze metal-organic framework (MOF) thin films, revealing crucial details about their structure and coordination bonding at the nanoscale. Understanding these local characteristics is key for developing MOF-based devices.
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