Probing Local Structural Variations in Metal-Organic Framework Thin Films Using Nano-FTIR.

Yukihiro Matsumoto1, Kento Takenaka1, Hiromasa Sato2

  • 1Department of Applied Physics and Physico-Informatics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan.

Summary

This study used advanced microscopy to analyze metal-organic framework (MOF) thin films, revealing crucial details about their structure and coordination bonding at the nanoscale. Understanding these local characteristics is key for developing MOF-based devices.

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