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Updated: May 26, 2026
12:28
Correlative Super-resolution and Electron Microscopy to Resolve Protein Localization in Zebrafish Retina
Published on: November 10, 2017
On Determination Method for Resolution of Secondary Electron Images in Scanning Electron Microscopy.
Tongfang Yang1, Yanbo Zou2, Zejun Ding1
1Hefei National Research Center for Physical Sciences at the Microscale and Department of Physics, University of Science and Technology of China, Hefei, Anhui, P. R. China.
Summary
This study introduces a new method for measuring scanning electron microscope (SEM) resolution using a sharpness-resolution conversion curve. This approach offers a scientifically sound and automated framework for evaluating SEM performance.
Area of Science:
- Materials Science
- Microscopy
- Physics
Background:
- Determining the resolving power of scanning electron microscopes (SEM) is a significant challenge.
- Current methods for measuring image resolution are inconsistent with ISO standards and the Rayleigh criterion.
Purpose of the Study:
- To establish a rational and objective scheme for determining SEM resolving power.
- To develop a method consistent with ISO terminology and established resolution criteria.
Main Methods:
- Developed a sharpness-resolution conversion curve method.
- Utilized Monte Carlo simulations for physical modeling of SEM imaging.
- Evaluated image sharpness and resolution using Rayleigh and Rose criteria on simulated secondary electron images.
Main Results:
- The study established non-linear conversion curves for realistic 3D resolution samples.
- The method allows for convenient programmed measurement routines.
- Demonstrated a scientifically sound framework for automatic SEM evaluation.
Conclusions:
- The sharpness-resolution conversion curve method provides a robust framework for objective SEM performance evaluation.
- This approach establishes a standardized and automated means to assess SEM resolving power.
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