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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
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Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
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Low-Cost Integrated Optical Microscope and Contact-Mode Atomic Force Microscope System Based on DVD Optical Pickup

Likang Wang1, Chenyu Dong1,2,3, Yufan Jin1

  • 1College of Engineering and Applied Sciences, Nanjing University, Nanjing 210023, China.

Sensors (Basel, Switzerland)
|May 27, 2026
PubMed
Summary
This summary is machine-generated.

We developed a low-cost, modular microscope combining optical and atomic force microscopy (AFM) using an optical pickup unit (OPU). This integrated system achieves stable imaging with real-time probe visualization and low noise.

Keywords:
atomic force microscopecontact-modeoptical imagingoptical pickup head

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Area of Science:

  • Instrumentation
  • Microscopy
  • Nanotechnology

Background:

  • Atomic Force Microscopy (AFM) traditionally faces challenges with unfixed focal planes, complicating real-time imaging.
  • Integrating optical and AFM capabilities requires overcoming limitations in probe visualization and system stability.

Purpose of the Study:

  • To design and implement a low-cost, modular integrated optical and AFM system.
  • To enable stable contact-mode AFM operation with real-time optical feedback.
  • To overcome imaging difficulties associated with unfixed focal planes in integrated microscopy.

Main Methods:

  • Utilized an optical pickup unit (OPU) by exploiting its fixed conjugate planes for stable imaging.
  • Optimized circuit design and scanning logic to minimize lens drift and system noise.
  • Employed off-the-shelf components and 3D-printed parts for modularity and ease of assembly.

Main Results:

  • Achieved stable contact-mode AFM operation with a signal noise of less than 2 nm.
  • Enabled real-time optical observation of the AFM probe and tip-sample position.
  • Demonstrated an optical resolution of 1.5 μm.
  • Developed a system characterized by low cost, easy assembly, and high expandability.

Conclusions:

  • The integrated optical and AFM system offers a cost-effective and stable solution for nanoscale imaging.
  • Exploiting OPU's fixed conjugate planes is effective in overcoming focal plane instability.
  • The modular design allows for future expandability and customization.