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Analysis of SEC-SAXS data via EFA deconvolution and Scatter
Published on: January 28, 2021
Yang Wang1, Siyuan Zhao1, Man Luo1
1State Key Laboratory of Precision and Intelligent Chemistry, University of Science and Technology of China Hefei Anhui 230026 China ldbin@ustc.edu.cn hyan@ustc.edu.cn jiangj1@ustc.edu.cn.
This study integrates X-ray absorption near-edge structure (XANES) and powder X-ray diffraction (PXRD) spectroscopy to predict material properties and infer crystal structures without prior crystallographic data. The novel framework enables efficient materials characterization and structure mining from spectral data alone.
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