MIDAS: a quantitative framework for high-energy diffraction microscopy. Part II: accuracy, robustness and best...

Area of Science:

• Materials Science
• Crystallography
• Experimental Physics

Background:

• In situ high-energy diffraction microscopy (HEDM) experiments are increasingly complex.
• Reproducible scientific outcomes require a quantitative understanding of HEDM data analysis.
• Current analysis parameter influences on microstructural reconstruction accuracy are not well-quantified.

Purpose of the Study:

• To systematically validate the HEDM data reduction methodology in the MIDAS software suite.
• To quantify the impact of key analysis parameters on microstructural reconstruction accuracy and precision.
• To establish best practices for HEDM data acquisition and analysis.

Main Methods:

• Utilized a dedicated Ti-7Al dataset for rigorous validation.
• Investigated both far-field (FF) and near-field (NF) HEDM techniques.
• Employed crystallographic consistency filtering to address diffraction peak overlap.

Main Results:

• Far-field HEDM grain position accuracy depends on diffraction vector diversity.
• Near-field HEDM orientation precision significantly improves with detector separation.
• The MIDAS methodology demonstrates robustness against experimental challenges like peak overlap.

Conclusions:

• Established a framework of best practices for HEDM data acquisition and analysis.
• Provided quantitative insights into HEDM analysis parameter sensitivities.
• Aimed to enhance the accuracy and reliability of HEDM microstructural reconstructions.