Detecting the full photoemission cone from laser-based ARPES experiments by leveraging deflector technology

Nicolas Gauthier1, Benson Kwaku Frimpong1, Dario Armanno1,2,3

  • 1Advanced Laser Light Source, Institut National de la Recherche Scientifique - Énergie Matériaux Télécommunications, Varennes, Quebec J3X 1P7, Canada.

Summary

Angle-resolved photoemission spectroscopy (ARPES) now captures all emitted electrons in a single measurement. This advancement allows comprehensive electronic band structure analysis of quantum materials with novel deflector technology.

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