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MOS Capacitor
MOSFET
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Mingjun Chen1, Yi Wei Ho2,3, MingRui Lai4,5
1Department of Chemistry, National University of Singapore, Singapore 117543, Singapore.
We observed exciton-enhanced shift current in strained monolayer MoS2. This phenomenon, driven by higher-order excitons, offers new ways to control photocurrent in advanced electronic materials.
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