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Updated: Jun 5, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
In situ mechanical characterization of functional and architected materials
Hanxun Jin1,2, Ming Chen3,4, Matias Kagias5
1Department of Mechanical Engineering, Northwestern University, Evanston, IL, USA.
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Recent advances in instrumentation have sparked a transformative journey in materials science, providing insights into the intricate relationship between processing, structure and properties. Among them, cutting-edge in situ micro- and nanoscale mechanical characterization methods, equipped with exceptional spatial and temporal resolution, such as instrumented electron microscopy, X-ray imaging and opto-acoustic techniques, have opened new frontiers in the study of emerging functional and architected materials, including low-dimensional materials, bio-inspired materials and three-dimensional architected metamaterials, underscoring the versatility of these innovative characterization techniques. Furthermore, the integration of artificial intelligence and machine learning offers promising opportunities to streamline high-throughput experimentation processes and enhance the efficiency and accuracy of characterization, and promote the design of next-generation materials. This Review provides a comprehensive overview of the latest micro- and nanoscale mechanical characterization methods. We highlight their interdisciplinary applications to functional and architected materials in the pursuit of solutions for energy, sustainability, semiconductor technology and healthcare.

