Related Experiment Video
Updated: Jun 6, 2026

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Si-doped CsSrI3 perovskites as potential dielectrics in MIM capacitors: recent advances, limitations and prospects
Yahaya Saadu Itas1,2,3, Mayeen Uddin Khandaker1,4,5, Rajesh Haldhar6
1Applied Physics and Radiation Technologies Group, CCDCU, Faculty of Engineering and Technology, Sunway University Bandar Sunway Selangor 47500 Malaysia mayeenk@diu.edu.bd yitas@sazu.edu.ng.
Abstract:
Halide perovskites have emerged as the current trending materials for applications in energy storage and other high-performance optoelectronic devices due to their charge-carrier dynamics, low defect density, enhanced breakdown voltage and high dielectric profiles. Si-doped materials, such as oxides and perovskites, play a significant role in high-efficiency capacitors because of the tunable charge storage mechanisms enabled by Si. Regulating the fabrication of Si-doped CsSrI3 dielectric materials is a crucial step to realize a practical metal-insulator-metal (MIM) capacitor with highly sustainable characteristics. Despite their potential, a recent literature survey shows that very few works have been performed on CsSrI3 perovskites, prompting further research on their various properties, especially in the context of charge storage. This review highlights the recent progress in Si-doped CsSrI3 perovskites as dielectric chips for MIM capacitor applications. The remaining challenges in the research on Si-based CsSrI3 perovskite optoelectronic devices are also discussed.
Related Concept Videos
MOS Capacitor
The metal gate is typically made from highly conductive materials such as aluminum or polysilicon. Beneath the metal gate lies a thin layer of...
Dielectric Polarization in a Capacitor
Capacitor With A Dielectric
Dielectrics are non-conducting materials with no free or loosely bound electrons. When a dielectric is...
Valence Bond Theory

