An induction heating system for in situ X-ray diffraction imaging: design, simulation and application to dislocation...

Area of Science:

• Materials Science
• Physics
• Engineering

Background:

• In situ X-ray diffraction (XRD) is crucial for understanding material behavior under dynamic conditions.
• Accurate temperature control and measurement are essential for time-resolved XRD experiments.
• Previous methods often lack the precision or temperature range required for advanced materials research.

Purpose of the Study:

• To introduce a novel compact induction heating system for time-resolved in situ X-ray diffraction imaging.
• To enable contact-free volumetric heating of samples up to ~1600°C with flexible operation.
• To integrate real-time, spatially resolved thermography for precise temperature monitoring.

Main Methods:

• Development of a compact induction heating system with integrated near-infrared thermography.
• Utilizing a 3D finite-element model for predicting electromagnetic heating, heat transfer, and thermo-elastic stress.
• Demonstration using synchrotron X-ray white-beam topography on an indented Si(001) wafer.

Main Results:

• Successful demonstration of contactless heating up to ~1600°C with real-time temperature mapping.
• Observation of dislocation activity initiating above 1000°C, correlating with simulated shear stresses.
• Quantitative correlation between experimentally observed dislocation density and simulated resolved shear stresses.

Conclusions:

• The developed system enables quantitative, time-resolved studies of dislocation dynamics under controlled thermal conditions.
• The integrated simulation-guided approach allows for tailoring temperature gradients and stress fields.
• This technology advances in situ materials characterization for designing novel materials and experiments.