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Published on: December 4, 2014
Buffer-Assisted Epitaxy of Large-Area Ultraflat θ-Tellurene with Mirror Symmetry
Erwen Zhang1, Wenfa Chen1, Pin Lyu1
1Key Laboratory for Intelligent Nano Materials and Devices of Ministry of Education, State Key Laboratory of Mechanics and Control of Mechanical Structures, and Institute for Frontier Science, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.
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Tellurene, covalently bonded tellurium (Te) atoms, is one of the most chemically tractable materials in the low-dimensional community. However, the monoelemental nature and structural simplicity limit synthesis-accessible tellurene merely in the β-phase, assembled by helical Te chains with a trigonal lattice. The nonplanar structure confines tellurene at the micrometer scale and poses technological challenges toward van der Waals integrations. Here, we report an ultraflat phase of tellurene, named as θ-tellurene, over the centimeter scale via a buffer-assisted epitaxial method on the Au(100) crystal. Such a tellurene phase possesses well-aligned flat-lying 1D Te chains in monatomic zigzag configuration, as verified by scanning tunneling microscopy, noncontact atomic force microscopy, scanning transmission electron microscopy, and density functional theory calculations. Ultraflat θ-tellurene evolves through extended Ostwald ripening and dissociation-triggered transformation on a Te buffer layer, initiated and controlled by postannealing treatment. θ-Tellurene exhibits an n-type semiconducting behavior with a band gap of ∼1.55 eV and exhibits 2-fold in-plane mirror symmetry.

