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Quantifying the localized electrical interface using a force-controlled scanning ion conductance microscopy.

Hongyu Wang1, Huiyao Shi2, Si Tang3

  • 1State Key Laboratory of Robotics and Intelligent Systems, Shenyang Institute of Automation, Chinese Academy of Sciences (CAS), Shenyang 110016, China.; University of the Chinese Academy of Sciences, Beijing 100049, China.

Journal of Colloid and Interface Science
|June 6, 2026
PubMed
Summary
This summary is machine-generated.

We developed a new scanning microscopy technique to map electrical double layer charges at interfaces. This method accurately quantifies interfacial properties, overcoming limitations of traditional approaches for advanced materials science.

Keywords:
Electric double layerInterface chargeLocalized charge mappingNanopipetteScanning probe microscopy

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Area of Science:

  • Interfacial Science
  • Surface Chemistry
  • Materials Science

Background:

  • The electrical double layer (EDL) is crucial for interfacial phenomena but difficult to measure due to its small scale and complex signal decoupling.
  • Conventional techniques struggle with reliable EDL measurements, highlighting a gap in theoretical understanding and experimental platforms.

Purpose of the Study:

  • To develop a novel measurement platform for localized charge characterization at solid-liquid interfaces.
  • To combine EDL-mediated charge mapping with quantitative electrokinetic modeling for advancing interfacial science.

Main Methods:

  • Developed a force-controlled scanning ion conductance microscopy (FCSICM) platform for high-resolution interface charge mapping.
  • Evaluated ion current rectification (ICR) sensitivity under various interfacial conditions (bias voltage, substrate polarity, electrolyte concentration).
  • Created a physically interpretable electrokinetic transport model to correlate experimental observations with theory.

Main Results:

  • FCSICM demonstrated stable probe-EDL engagement and sensitive mapping of surface charge distribution.
  • ICR showed strong dependence on interfacial conditions, with optimal performance at high bias voltage and low electrolyte concentration.
  • The quantitative electrokinetic model accurately reproduced experimental current-voltage characteristics, enabling quantitative analysis of ion rectification.

Conclusions:

  • FCSICM successfully mapped topography and surface charge synchronously, differentiating material interfaces with high consistency.
  • The developed platform and model establish a new quantitative approach for interfacial science, overcoming limitations of conventional methods.