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Updated: Jun 8, 2026

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy
Published on: July 10, 2019
Hongyu Wang1, Huiyao Shi2, Si Tang3
1State Key Laboratory of Robotics and Intelligent Systems, Shenyang Institute of Automation, Chinese Academy of Sciences (CAS), Shenyang 110016, China.; University of the Chinese Academy of Sciences, Beijing 100049, China.
We developed a new scanning microscopy technique to map electrical double layer charges at interfaces. This method accurately quantifies interfacial properties, overcoming limitations of traditional approaches for advanced materials science.
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