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Related Concept Videos

Voltammetry: Factors Affecting Measurements01:21

Voltammetry: Factors Affecting Measurements

A current produced due to the redox reactions of the analyte at the working and auxiliary electrodes is called a faradaic current. The reaction can be divided into two types. The current generated due to the reduction of the analyte is called cathodic current, and it carries a positive charge. In contrast, the current produced by analyte oxidation is known as an anodic current, and it has a negative charge. The applied potential at the working electrode determines the faradaic current flow, and...
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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Updated: Jun 11, 2026

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
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Topography Influence on Noble Metals' Work Function Measured In Vacuo by Photoelectron Spectroscopy and Kelvin Probe

Artem M Dmitriev1, Marcin Kisiel1, Akash Gupta1

  • 1Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland.

ACS Applied Materials & Interfaces
|June 9, 2026
PubMed
Summary

Surface roughness significantly impacts a material's work function (WF). This study found that increasing surface roughness, characterized by amplitude and slope, leads to a decrease in the work function for gold and silver thin films. In-vacuum measurements are crucial for accurate WF determination.

Keywords:
Kelvin probe force microscopygoldphotoelectron spectroscopysilversurface roughnesstopographywork function

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Area of Science:

  • Surface Science
  • Materials Science
  • Condensed Matter Physics

Background:

  • The work function (WF) is critical for electron emission and is influenced by surface properties.
  • Previous studies indicate roughness affects WF, but a clear quantitative relationship is lacking.
  • Surface topography parameters like amplitude and slope are key factors influencing surface properties.

Purpose of the Study:

  • To investigate and quantify the dependence of work function on surface roughness for gold and silver thin films.
  • To establish a relationship between work function and specific topography parameters (amplitude, slope).
  • To highlight the importance of in-vacuum measurements for accurate work function determination.

Main Methods:

  • Work function measurements using in-vacuum ultraviolet photoelectron spectroscopy (UPS) and Kelvin probe force microscopy (KPFM).
  • Surface topography characterization via 3D laser confocal microscopy and atomic force microscopy.
  • Analysis of work function dependence on roughness parameters (amplitude and slope) for thin films on stainless steel.

Main Results:

  • Work function decreases with increasing surface roughness for gold and silver thin films.
  • A logarithmic or linear relationship was observed between WF and roughness, depending on the parameter used.
  • In-vacuum measurements confirmed consistent results across different sample morphologies.

Conclusions:

  • Surface roughness, specifically amplitude and slope, directly influences the work function.
  • Accurate work function measurements necessitate in-vacuum conditions to avoid air contamination effects.
  • The observed decrease in WF with roughness is linked to surface dipole formation due to electronic redistribution.