Experimental characterization of after-pulsing probability in InGaAs/InP-based single-photon avalanche photodiodes

Abdallah Karmalawi1,2,3, Sun Do Lim1, Dong-Hoon Lee1,2

  • 1Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea.

Summary

Researchers developed a new automated tool to measure after-pulsing, a common type of noise in single-photon detectors. By replacing manual data review with a precise algorithm, this system quickly maps how different operating settings affect detector performance. The findings show that increasing dead time and using gated operation significantly lower noise levels, which helps improve technologies like quantum communication and LiDAR.

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