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Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
Published on: July 27, 2018
Yintao Ma1,2, Pan Chen1,2, Mingzhi Yu3,4
1State Key Laboratory for Manufacturing Systems Engineering, State Industry-Education Integration Center for Medical Innovations, International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Shaanxi Innovation Center for Special Sensing and Testing Technology in Extreme Environments, Shaanxi Provincial University Engineering Research Center for Micro/Nano Acoustic Devices and Intelligent Systems, Xi'an Jiaotong University, Xi'an, 710049, China.
Researchers developed wafer-level MEMS atomic vapor cells for Rydberg-atom electrometry. This breakthrough enables miniaturized, batch-manufactured devices for sensitive electric field measurements, advancing chip-scale applications.
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