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Updated: Jun 12, 2026

Solution-Processed, Surface-Engineered, Polycrystalline CdSe-SnSe Exhibiting Low Thermal Conductivity
Published on: May 17, 2024
Refractive index and thermo-optic coefficients of single- and poly-crystalline ZnSe
Abstract:
The refractive indices of single-crystal and polycrystalline ZnSe samples were measured using the Cryogenic High Accuracy Refraction Measurement System (CHARMS) located at the Goddard Space Flight Center (GSFC) from 1 to 4.5 µm and between 30 and 325 K. The results of these experiments and comparisons with previous data are reported here. The single measurement uncertainty derived from these CHARMS results is estimated to be less than 8.7E-5.
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