Interference and Diffraction
Phase Contrast and Differential Interference Contrast Microscopy
IR Spectrometers
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Updated: Jun 13, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Yongjie Wang1,2, Conghui Zhu1, Wenxi Zhang1,2
1Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100094, China.
A new compact dual-oblique-fiber heterodyne phase-shifting point diffraction interferometer (DOF-HPSPDI) offers a low-cost, stable solution for optical testing. This innovative design precisely measures wavefronts for applications like large-aperture component stitching.
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