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Updated: Jun 16, 2026

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Ferroelectric Dynamic-Field-Driven Nucleation and Growth Model for Predictive Materials-To-Circuit Co-Design
Yi Liang1,2, Soohyeon Kim3, Tony Chiang1,2
1Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan, USA.
Existing ferroelectric switching models fail under real operating conditions. A new dynamic-field-driven nucleation and growth (DFNG) model accurately captures ferroelectric switching dynamics under arbitrary voltage waveforms.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Electrical Engineering
Background:
- Standard ferroelectric switching models (Kolmogorov-Avrami-Ishibashi, nucleation-limited switching) assume constant electric fields, which is unrealistic for real devices.
- Real ferroelectric devices operate under mixed and distorted time-varying voltages, rendering current models inadequate for accurate interpretation of switching dynamics.
Purpose of the Study:
- Introduce a novel compact dynamic-field-driven nucleation and growth (DFNG) model.
- Enable quantitative analysis of ferroelectric switching transients under arbitrary voltage waveforms.
- Facilitate predictive materials-circuit co-design for next-generation ferroelectric technologies.
Main Methods:
- Developed a compact dynamic-field-driven nucleation and growth (DFNG) model.
- Applied the DFNG model to fit switching transients across multiple ferroelectric materials.
- Coupled the DFNG model with application-related waveforms and a circuit-level simulation platform.
Main Results:
- The DFNG model enables quantitative fits to switching transients, extracting time-varying domain wall velocity and growth dimensionality.
- The model successfully operates under arbitrary voltage waveforms, overcoming limitations of previous frameworks.
- Demonstrated linking of nucleation and growth parameters to device performance metrics like memory window, disturb error, speed, and energy dissipation.
Conclusions:
- The DFNG model provides a robust framework for understanding and predicting ferroelectric switching dynamics under realistic operating conditions.
- This model is crucial for advancing materials-circuit co-design, optimizing performance for next-generation ferroelectric devices.
- The developed model enhances the predictive capability for ferroelectric device behavior across diverse applications and operating scales.
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