Ferroelectric Dynamic-Field-Driven Nucleation and Growth Model for Predictive Materials-To-Circuit Co-Design

Yi Liang1,2, Soohyeon Kim3, Tony Chiang1,2

  • 1Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan, USA.

Summary

Existing ferroelectric switching models fail under real operating conditions. A new dynamic-field-driven nucleation and growth (DFNG) model accurately captures ferroelectric switching dynamics under arbitrary voltage waveforms.

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