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Determining the Free-Carrier Fraction in 2D Perovskites Using Power Dependent Photoluminescence
Antonella Cutrupi1,2,3, Marc Meléndez1,2, Raquel Utrera-Melero1,2
1Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, 28049 Madrid, Spain.
The Journal of Physical Chemistry Letters
|June 16, 2026
Summary
This study introduces a new method to quantify free-carrier fraction in semiconductors using photoluminescence. This approach accurately analyzes excited states in materials like perovskites, crucial for optoelectronic device design.
Area of Science:
- Materials Science
- Solid State Physics
- Optoelectronics
Background:
- Distinguishing between excitons and free carriers in nanostructured materials is vital for designing efficient optoelectronic and photovoltaic devices.
- Traditional power-law analysis of photoluminescence can oversimplify the physics of excited states, especially in materials with intermediate exciton binding energies.
Purpose of the Study:
- To develop a direct and quantitative method for analyzing the free-carrier fraction in semiconductors.
- To validate the proposed method using Ruddlesden-Popper perovskites with varying thicknesses as a model system.
- To provide a reliable tool for probing the nature of optically excited states and spatial variations in charge carrier fractions.
Main Methods:
- Utilizing power-dependent peak photoluminescence measurements.
- Applying the Saha equation for quantitative analysis of the free-carrier fraction.
- Investigating Ruddlesden-Popper perovskites with controlled thickness variations.
Main Results:
- The developed method provides a quantitative analysis of the free-carrier fraction, consistent with known exciton binding energies in perovskites.
- The approach successfully probes spatial variations in free charge fractions at micrometer resolution, particularly near grain boundaries.
- The study highlights the impact of excitation density on excited-state interpretation, emphasizing the need for realistic operating conditions.
Conclusions:
- The presented photoluminescence analysis offers a simple, effective, and reliable tool for determining excited-state dynamics in semiconductors.
- This method is crucial for optimizing materials for optoelectronic and photovoltaic applications by accurately characterizing charge carrier behavior.
- Accurate characterization under relevant excitation densities is essential to avoid misinterpretation of excited-state properties.
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