X-ray-irradiated KCl:Eu2+ single crystal as a deformation-quantitative indicator sensitive to applied strain and load

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Updated: Jun 18, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Yohichi Kohzuki1

  • 1Department of Mechanical Engineering, Saitama Institute of Technology, Fukaya, Saitama, Japan.

Iscience
|June 17, 2026
PubMed

Keywords:
condensed matter physicsmaterials scienceoptical materials

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