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Related Concept Videos

Non-ohmic Devices00:51

Non-ohmic Devices

In most substances, the current flow is proportional to the voltage applied to it. A simple relationship between the values of current, voltage, and resistance is known as Ohm's law. Nonohmic devices do not exhibit a linear relationship between voltage and current. One such device is the semiconducting circuit element known as a diode. A diode is a circuit device that allows current flow in only one direction.
Consider a simple circuit consisting of a battery, a diode, and a resistor. A diode...

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Physical Unclonable Function Based on 3D-NAND Flash Array Structure With Multi-Chip Implementation.

Hwiho Hwang1, Sangwook Youn1, Jinwoo Park1

  • 1Division of Materials Science and Engineering and Department of Semiconductor Engineering, Hanyang University, Seoul, South Korea.

Small (Weinheim an Der Bergstrasse, Germany)
|June 17, 2026
PubMed
Summary
This summary is machine-generated.

This study introduces a novel hardware security primitive using 3D-NAND flash, leveraging intrinsic current variations for unique device fingerprints. This approach offers a scalable and reliable solution for secure hardware, avoiding degradation issues found in conventional methods.

Keywords:
NAND flashcharge trapping materialin‐memory computingphysical unclonable function (PUF)

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Area of Science:

  • Electrical Engineering
  • Computer Engineering
  • Materials Science

Background:

  • Physical Unclonable Functions (PUFs) are hardware security primitives using device variations for unique fingerprints.
  • Conventional CMOS-based PUFs suffer from large area and power consumption.
  • Existing PUF methods can lead to degradation due to stress.

Purpose of the Study:

  • To propose a novel PUF design utilizing 3D-NAND flash memory.
  • To leverage intrinsic string current variations for secure device identification.
  • To overcome limitations of conventional PUFs, including area, power, and degradation.

Main Methods:

  • A PUF architecture based on 3D-NAND flash arrays was developed.
  • Read operations were employed for Challenge-Response Pair (CRP) extraction, avoiding stress.
  • String select lines and bitlines applied challenges, with wordlines acting as PUF chips.

Main Results:

  • Fabricated planar NAND flash arrays confirmed current variability due to process variations.
  • A 3D-NAND PUF achieved near-ideal metrics, passing statistical tests and ML attack simulations.
  • The design demonstrated high CRP capacity due to 3D-NAND's cell density.

Conclusions:

  • 3D-NAND flash offers a promising platform for scalable and reliable hardware security.
  • The proposed PUF design is robust against degradation and attacks.
  • This approach enables integration of multiple PUF chips within a single array for enhanced security.