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Four-Dimensional CT Analysis Using Sequential 3D-3D Registration
Published on: November 23, 2019
Xianyun Qian1, Fei Wen1, Peilin Liu1
1School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai 200240, China.
This study introduces Simultaneous Inlier Identification and Model Estimation (SIME), a novel framework for robust 3D registration. SIME effectively handles noise and outliers, improving accuracy in computer vision and robotics applications.
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