A Robust 3D Registration Method via Simultaneous Inlier Identification and Model Estimation

Xianyun Qian1, Fei Wen1, Peilin Liu1

  • 1School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai 200240, China.

Journal of Imaging
|June 25, 2026
PubMed
Summary

This study introduces Simultaneous Inlier Identification and Model Estimation (SIME), a novel framework for robust 3D registration. SIME effectively handles noise and outliers, improving accuracy in computer vision and robotics applications.