Related Experiment Video

Updated: Jun 27, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Ultrafast carrier dynamics in high-density photo-doped MoS2: monolayer vs multilayer

Durga Prasad Khatua1, Asha Singh2, Sabina Gurung3

  • 1Mechanical and Aerospace Engineering Department, University of California Los Angeles, Los Angeles, CA 90095, United States of America.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|June 25, 2026
PubMed

Keywords:
MoS2high-density photoexcitationintervalley scatteringultrafast carrier dynamicsundefined

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