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Parameter-Efficient Fine-Tuning for Photovoltaic Cell Defect Classification: A Systematic Comparison of LoRA, QLoRA,
Seda Bayat Toksöz1, Gültekin Işık1, Gökhan Şahin2,3
1Department of Computer Engineering, Iğdır University, Iğdır 76000, Türkiye.
Parameter-efficient fine-tuning (PEFT) methods like QLoRA offer a resource-efficient alternative for photovoltaic (PV) cell defect classification. These methods slightly outperform full fine-tuning while significantly reducing computational costs.
Area of Science:
- Materials Science
- Computer Vision
- Machine Learning
Background:
- Automated visual inspection is crucial for photovoltaic (PV) module quality assurance.
- Adapting deep learning models for PV defect classification faces challenges like high memory requirements, imbalanced datasets, and computational constraints for edge deployment.
- Parameter-efficient fine-tuning (PEFT) methods are underexplored in PV defect classification despite their success in natural language processing.
Purpose of the Study:
- To benchmark Parameter-efficient fine-tuning (PEFT) methods, specifically Low-Rank Adaptation (LoRA) and Quantized LoRA (QLoRA), against full fine-tuning for photovoltaic (PV) cell defect classification.
- To evaluate the performance and resource efficiency of different PEFT strategies on a real-world PV defect dataset.
Main Methods:
- A ConvNeXt-Tiny backbone was used for defect classification on the POLY dataset (17,377 images) of polycrystalline PV cells.
- Four adaptation strategies were compared: full fine-tuning, LoRA (rank 8 and 16), and 4-bit QLoRA (rank 16).
- Experiments preserved natural class imbalance and used a group-aware StratifiedGroupKFold protocol to ensure robust evaluation.
Main Results:
- All PEFT variants achieved slightly higher macro-F1 scores than full fine-tuning while training significantly fewer parameters (26-52x less).
- QLoRA with rank 16 (QLoRA_r16) yielded the highest macro-F1 score (79.92 ± 0.75%), outperforming full fine-tuning (78.26 ± 0.94%).
- QLoRA_r16 demonstrated reduced peak GPU memory usage (~30% lower than full fine-tuning) and improved F1 scores for intact and surface-diffuse defect classes.
Conclusions:
- Parameter-efficient fine-tuning (PEFT) presents a promising, resource-efficient approach for photovoltaic (PV) cell defect classification.
- QLoRA, in particular, shows potential for improving classification accuracy and reducing computational demands.
- Further research is needed to isolate the effects of quantization and adapter rank, and to validate performance on embedded devices.
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