Novel Integrated Technology of Pixelized Inorganic Scintillator Wafers for X-Rays and Neutron Detection
Petr S Sokolov1, Lydia V Ermakova1, Aliaksei G Bondarau2
1National Research Centre «Kurchatov Institute», 123098 Moscow, Russia.
None:
Pixelated detectors based on inorganic scintillation materials are widely used in radiation detection systems for medical imaging and many other fields of science and technology. A substantial application is X-ray scanning using flat-panel detectors (FPDs) for both fluorography and mammography. In this article, the detection properties of the monolithic planar ceramic scintillation elements are reported for the first time. A high-light yield (Gd,Y)3Al2Ga3O12:Ce,Mg garnet-type scintillation material was used to form square-shaped pixels, while a material of similar composition was used as a substrate. Green bodies were successfully fabricated by a digital light processing (DLP) 3D printing method. Subsequent debinding and pressureless high-temperature sintering resulted in composite elements consisting of two layers with different chemical compositions. The lower bulk layer consisted of transparent, non-luminescent garnet, whereas the upper pixelated layer, with pixel dimensions of 230 × 230 µm, was made of scintillation material. The spatial resolution of the matrices under UV light and alpha-particle excitation was evaluated. It was confirmed that the spatial resolution of the matrices produced by the developed technology is approximately 0.4 times the pixel size. The proven ability of the integrated technology of inorganic scintillation matrix production opens the way for future improvement in spatial resolution through optimizing the printed pixel dimensions.
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