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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Jinhyun Kim1, Byeongjin Kim1, Minkyu Park1
1Department of Electrical and Computer Engineering (ECE) and Institute of New Media and Communications (INMC), Seoul National University, Seoul, Republic of Korea.
This study introduces STARE, the first semiconductor-foundry-manufacturable reconfigurable intelligent surface (RIS). This scalable, low-power technology enables efficient beam steering for future wireless systems.
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