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Updated: Jul 7, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
Arindam Phani1, Eric Finot2, Seonghwan Kim1
1Department of Mechanical and Manufacturing Engineering, University of Calgary, Calgary, Alberta, Canada.
This study introduces a modified tapping mode for atomic force microscopy (AFM) that enhances sensitivity to local mechanical properties in soft materials. The new method reveals finer internal heterogeneity and dissipation-linked features in biological samples like insulin aggregates.
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